国产一卡2卡三卡4卡麻豆_了解最新日韩草逼视频_h片在线播放一区_国产激情影视在线_好了av四色综合无码久久_欧美黑白双插OOR720P_日本精品中文字幕在线_秋霞午夜手机影院_亚洲国产一区二区3da毛片_欧美杂交深喉video中文字幕

Differential Interference Contrast
The use of Differential Interference Contrast (DIC) with large format line scan sensors and high resolution optics enable semiconductor, FPD, electronics and other industries to quickly image subtle surface structures and details which are not normally visible. The ability to image and subsequently analyze these structures leads to greater manufacturing
efficiencies and production throughput.
Automated Focus and Illumination
The LFOV DIC microscope is able to incorporate any one of WDIs Autofocus Sensors and High Power LED illumination options to create a compley autonomous inspection system. The flexibility in autofocus and illumination allows the LFOV DIC to be used in a wide variety of manufacturing applications including semiconductor, FPD, OLED, packaging and photovoltaic and solar panel inspection.
Practical Design
To meet the requirements of in line manufacturing, the LFOV DIC microscope features rugged industrial components, a small
footprint and low weight. Its modular nature allows it to be compley upgradable, ensuring the best performance for all
 

current and future applications.

LARGE FIELD OF VIEW DIC MODULAR MICROSCOPE